Experimental determination of the extinction factor by the use of polarized X-rays

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DC Field	Value	Language
dc.contributor.author	Chandrasekhar, S.	-
dc.contributor.author	Ramaseshan, S.	-
dc.contributor.author	Singh, A.K.	-
dc.date.accessioned	2012-07-10T11:34:58Z	-
dc.date.available	2012-07-10T11:34:58Z	-
dc.date.issued	1969-01	-
dc.identifier.citation	Acta Crystallographica A, 1969, Vol.25, p140	en
dc.identifier.uri	http://hdl.handle.net/2289/4828	-
dc.description	Restricted Access.	en
dc.description.abstract	The problem of estimating the extinction factor by use of polarized X-rays has been re-examined in the light of the theory of X-ray diffraction in real crystals developed recently by Zachariasen. Expressions are given for deriving the extinction-free structure factors in terms of the observed integrated intensities for perpendicular and parallel polarizations. A simple attachment to a diffractometer for analysing the polarization of the diffracted beam is described. Measurements on quartz are presented; the extinction-free structure factors so obtained are in excellent agreement with Zachariasen's calculated values based on new f curves.	en
dc.language.iso	en	en
dc.publisher	International Union of Crystallography	en
dc.relation.uri	http://dx.doi.org/10.1107/S0567739469000234	en
dc.relation.uri	http://adsabs.harvard.edu/abs/1969AcCrA..25..140C	en
dc.rights	1969 International Union of Crystallography	en
dc.title	Experimental determination of the extinction factor by the use of polarized X-rays	en
dc.type	Article	en
Appears in Collections:	Research Papers (SCM)

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