Please use this identifier to cite or link to this item:
http://hdl.handle.net/2289/4999Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Viswamitra, M.A. | - |
| dc.contributor.author | Ramaseshan, S. | - |
| dc.date.accessioned | 2012-07-19T09:07:38Z | - |
| dc.date.available | 2012-07-19T09:07:38Z | - |
| dc.date.issued | 1963 | - |
| dc.identifier.citation | Zeitschrift fur Kristallographie, 1963, Vol.119, p73 | en |
| dc.identifier.issn | 0044-2968 | - |
| dc.identifier.uri | http://hdl.handle.net/2289/4999 | - |
| dc.description | Restricted Access | en |
| dc.language.iso | en | en |
| dc.publisher | Oldenbourg Verlag | en |
| dc.rights | 1963 Oldenbourg Verlag | en |
| dc.title | Back-reflection x-ray camera for thermal-expansion studies and the thermal expansion of Nac1 from -180c to 200c | en |
| dc.type | Article | en |
| Appears in Collections: | Miscellaneous Publications | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 1963_Zeitschrift fur Kristallographie_V119_p79.pdf | Restricted Access | 326.3 kB | Adobe PDF | View/Open |
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