Please use this identifier to cite or link to this item:
http://hdl.handle.net/2289/5010
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Ramesh, T.G. | - |
dc.contributor.author | Ramaseshan, S. | - |
dc.date.accessioned | 2012-07-19T09:37:00Z | - |
dc.date.available | 2012-07-19T09:37:00Z | - |
dc.date.issued | 1971 | - |
dc.identifier.citation | NAL Scientific Review, 1971, p1 | en |
dc.identifier.uri | http://hdl.handle.net/2289/5010 | - |
dc.description | Restricted Access | en |
dc.language.iso | en | en |
dc.publisher | National Aeronautical Laboratory | en |
dc.rights | 1971 National Aeronautical Laboratory | en |
dc.title | Application of x-ray and electron spectroscopy to materials science | en |
dc.type | Other | en |
Appears in Collections: | Miscellaneous Publications |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
1971_NAL Scientific Review_SR_1.pdf | Restricted Access | 460.23 kB | Adobe PDF | View/Open |
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