Elemental analysis of borosilicate, quartz, soda and lead glasses through energy dispersive X-ray analysis (EDX) method

Please use this identifier to cite or link to this item: http://hdl.handle.net/2289/6986

Full metadata record

DC Field	Value	Language
dc.contributor.author	Dhason, A.	-
dc.date.accessioned	2018-08-15T17:48:26Z	-
dc.date.available	2018-08-15T17:48:26Z	-
dc.date.issued	2018-07	-
dc.identifier.citation	B.S.S.G. Journal, 2018, Vol.56, p123-127	en_US
dc.identifier.uri	http://hdl.handle.net/2289/6986	-
dc.description	Restricted Access.	en_US
dc.description.abstract	Scanning Electron Microscope (SEM) can be used for imaging samples at higher magnification of about one million times which we cannot achieve in the light microscope. The EDX analysis system works as an integral part of a SEM and cannot operate on its own. It is a technique used for identifying the elemental compositions, contaminants or defects of the samples. During the EDX analysis, the samples are bombarded with an electron beam as the experiment is well suited for electrically conducting samples. Glass is a poor conductor of electricity which needs to have a thin conductive coating to prevent the charging of electron. This work describes the output of the elemental analysis done in our laboratory for the above four glasses.	en_US
dc.language.iso	en	en_US
dc.publisher	The British Society of Scientific Glassblowers	en_US
dc.rights	2018 The British Society of Scientific Glassblowers.	en_US
dc.title	Elemental analysis of borosilicate, quartz, soda and lead glasses through energy dispersive X-ray analysis (EDX) method	en_US
dc.type	Article	en_US
Appears in Collections:	Research Papers (SCM)

Files in This Item:

File	Description	Size	Format
2018_BSSG Journal_V56_p123.pdf Restricted Access	Restricted Access	26.5 MB	Adobe PDF	View/Open Request a copy