Surface Metrology using One-element Interferometry

Balasubramanyam, R.

Please use this identifier to cite or link to this item: http://hdl.handle.net/2289/7687

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DC Field	Value	Language
dc.contributor.author	Balasubramanyam, R.	-
dc.date.accessioned	2021-02-19T08:53:48Z	-
dc.date.available	2021-02-19T08:53:48Z	-
dc.date.issued	2015	-
dc.identifier.citation	URSI Asia-Pacific Radio Science Conference (AP-RASC), 2015, Gran Canaria, Spain	en_US
dc.identifier.isbn	Electronic ISBN:978-908-25987-5-9	-
dc.identifier.isbn	USB ISBN:978-908-25987-4-2	-
dc.identifier.uri	http://hdl.handle.net/2289/7687	-
dc.description	Restricted Access.	en_US
dc.description.abstract	Surface metrology is the key to make and retain high quality surfaces. There are many coordinate measurement methods and machines to measure large 3D surfaces. Some methods are: triangulation, time-of-flight, structured-lighting, photogrammetry and radio-holography. They differ in ease-of-use, economy, complexity and accuracy. Some, e.g. photogrammetry, measure point-by-point while others, e.g. holography, measure a point-cloud at one go. Some are spot-measurements while others are areal averages. Both photogrammetry and radio-holography are used to measure the surfaces of astronomical telescopes. Both phase-referenced and phase-recovered holographic techniques are used. In this paper we present yet another method to measure surfaces of large astronomical telescopes.	en_US
dc.language.iso	en	en_US
dc.publisher	IEEE	en_US
dc.relation.uri	https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=7303182	en_US
dc.rights	2015, IEEE	en_US
dc.title	Surface Metrology using One-element Interferometry	en_US
dc.type	Article	en_US
dc.additional	Date of Conference : 16-24 May 2015, Gran Canaria, Spain	en_US
Appears in Collections:	Research Papers (A&A)

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