Surface Metrology using One-element Interferometry

Please use this identifier to cite or link to this item: http://hdl.handle.net/2289/7687

Title:	Surface Metrology using One-element Interferometry
Authors:	Balasubramanyam, R.
Issue Date:	2015
Publisher:	IEEE
Citation:	URSI Asia-Pacific Radio Science Conference (AP-RASC), 2015, Gran Canaria, Spain
Abstract:	Surface metrology is the key to make and retain high quality surfaces. There are many coordinate measurement methods and machines to measure large 3D surfaces. Some methods are: triangulation, time-of-flight, structured-lighting, photogrammetry and radio-holography. They differ in ease-of-use, economy, complexity and accuracy. Some, e.g. photogrammetry, measure point-by-point while others, e.g. holography, measure a point-cloud at one go. Some are spot-measurements while others are areal averages. Both photogrammetry and radio-holography are used to measure the surfaces of astronomical telescopes. Both phase-referenced and phase-recovered holographic techniques are used. In this paper we present yet another method to measure surfaces of large astronomical telescopes.
Description:	Restricted Access.
URI:	http://hdl.handle.net/2289/7687
ISBN:	Electronic ISBN:978-908-25987-5-9 USB ISBN:978-908-25987-4-2
Alternative Location:	https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=7303182
Copyright:	2015, IEEE
Additional information:	Date of Conference : 16-24 May 2015, Gran Canaria, Spain
Appears in Collections:	Research Papers (A&A)

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